IEST-STD-CC1246E –
A New Way of Doing Business
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This class will describe the new IEST-STD-CC1246E, with changes to both particle size distribution and nonvolatile residue descriptions. A new visual inspection method is added as well.
Course outline Who should attend? Course materials Instructors
Course outline
- Background: Scope, use, and purpose
- Particle size distribution
- Equation: Presentation, discussion, and chart
- Table 1 Particle cleanliness levels: Description and differences from version D
- Other particle size distribution methods
- Percent area coverage
- Particle fallout
- Visual inspection
- Nonvolatile Residue
- Table 2: Description and differences from version D
- Examples of specifying product cleanliness levels
- Application of cleanliness levels
- Measurements of cleanliness
- Direct
- Extractive
- Indirect
- Statistical analysis and reporting
- Control limits
- Recording data
- Protection
- Inspection
- Other resources
Who should attend?
You need to gain information on IEST-STD-CC1246 because:
- You are an engineer or manager who uses IEST-STD-CC1246 to describe the cleanliness of surfaces and fluids used in your business
Course materials
- Copy of IEST-STD-CC1246: Product Cleanliness Levels – Applications, Requirements, and Determination
- Copy of PowerPoint presentation in a course binder
- Certificate of course attendance with completion of CEUs
Continuing Education Units: .3 CEUs
Instructor
Jack Sanders