IEST-STD-CC1246E –
A New Way of Doing Business
 iest

This class will describe the new IEST-STD-CC1246E, with changes to both particle size distribution and nonvolatile residue descriptions. A new visual inspection method is added as well.

Course outline     Who should attend?     Course materials     Instructors

Course outline
  • Background: Scope, use, and purpose
  • Particle size distribution
    • Equation: Presentation, discussion, and chart
    • Table 1 Particle cleanliness levels: Description and differences from version D
  • Other particle size distribution methods
    • Percent area coverage
    • Particle fallout
    • Visual inspection
  • Nonvolatile Residue
    • Table 2: Description and differences from version D
  • Examples of specifying product cleanliness levels
  • Application of cleanliness levels
  • Measurements of cleanliness
    • Direct
    • Extractive
    • Indirect
  • Statistical analysis and reporting
    • Control limits
    • Recording data
  • Protection
    • Short-term
    • Packaging
  • Inspection
  • Other resources
Who should attend?

You need to gain information on IEST-STD-CC1246 because:
  • You are an engineer or manager who uses IEST-STD-CC1246 to describe the cleanliness of surfaces and fluids used in your business
Course materials
  • Copy of IEST-STD-CC1246: Product Cleanliness Levels – Applications, Requirements, and Determination
  • Copy of PowerPoint presentation in a course binder
  • Certificate of course attendance with completion of CEUs
Continuing Education Units: .3 CEUs

Instructor

Jack Sanders