IEST-STD-CC1246E – A New Way of Doing Business

This class will describe the new IEST-STD-CC1246E, with changes to both particle size distribution and nonvolatile residue descriptions. A new visual inspection method is added as well.

Course outline     Who should attend?     Course materials     Instructors

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Course outline

• Background: Scope, use, and purpose
• Particle size distribution
  • Equation: Presentation, discussion, and chart
  • Table 1 Particle cleanliness levels: Description and differences from version D
• Other particle size distribution methods
  • Percent area coverage
  • Particle fallout
  • Visual inspection
• Nonvolatile Residue
  • Table 2: Description and differences from version D
• Examples of specifying product cleanliness levels
• Application of cleanliness levels
• Measurements of cleanliness
  • Direct
  • Extractive
  • Indirect
• Statistical analysis and reporting
  • Control limits
  • Recording data
• Protection
  • Short-term
  • Packaging
• Inspection
• Other resources

Who should attend?

You need to gain information on IEST-STD-CC1246 because:

• You are an engineer or manager who uses IEST-STD-CC1246 to describe the cleanliness of surfaces and fluids used in your business

Course materials

• Copy of IEST-STD-CC1246: Product Cleanliness Levels – Applications, Requirements, and Determination
• Copy of PowerPoint presentation in a course binder
• Certificate of course attendance with completion of CEUs

Continuing Education Units: .3 CEUs

Instructor

Jack Sanders