IEST Awards Recipients 2010

Award citations

Vesta Bateman Edward Davis

John Weaver

Richard Heine

Vesta Bateman

 
Edward Davis John Weaver Richard Heine
 David Chandler  Kenneth Thompson  Fredric Fey  Anne Marie Dixon
 David Chandler

 
 Kenneth Thompson  Fredric Fey  Anne Marie Dixon
 Milena Krasich  Lori Uram  Ed Pennell  Eve Mattingley-Hannigan
Milena Krasich

 
 Lori Uram Ed Pennell  Eve Mattingley-Hannigan
       

IEST Fellow
Vesta I. Bateman, for her substantial contributions, as an outstanding mechanical engineer and international expert, to instrumentation, measurement, analysis, and laboratory simulation of the pyroshock environment and assessment of its effects on materiel.

Edward B. Davis, for his innovative contributions to the advancement of contamination control technology in the field of cleanroom garments, and for his long-standing support of IEST.

Maurice Simpson Technical Editors Award
Contamination Control
John Weaver, Mark Voorhis, and Ron Reifenberger, for their paper, “Nanometrology Room Design: The Performance and Characterization of the Kevin G. Hall High-Accuracy Laboratory,” published in the 2009 Journal of the IEST.

Design, Test, and Evaluation
Yuxun Zhou, Gustavo Plaza, Abhijit Dasgupta, and Michael Osterman, for their paper, “Vibration Durability of Sn3.0Ag0.5Cu (SAC305) Solder Interconnects: Harmonic and Random Excitation,” published in the 2009 Journal of the IEST.

Product Reliability
Richard Heine and Donald Barker, for their paper, “Acceleration-Based Remaining Life Prognostics for Terrain-Loaded Components on an Army Ground Vehicle System,” published in the 2009 Journal of the IEST.

Robert L. Mielke Award
David Chandler, for his exceptional leadership and outstanding contributions as Chair of WG-CC014, Calibrating Particle Counters, and his professionalism, dedication, hard work, and innovative abilities.

Edward A. Szymkowiak Award
Kenneth Thompson, for his technical expertise in environmental testing and invaluable leadership in the ongoing efforts to revise the internationally recognized MIL-STD-810, particularly his considerable contributions in overseeing the development of MIL-STD-810G.

Willis J. Whitfield Award
Chris Muller, for his insightful published contributions on airborne molecular contamination (AMC) control, including a paper that received a Maurice Simpson Technical Editors Award in 2008.

Reliability Test and Evaluation Award
Pantelis Vassiliou, for his vision and outstanding contributions to the reliability and test communities in driving the development of a reliability analysis tool set that comprehensively integrates the reliability sciences with accelerated test technology.

Al Lieberman Mentoring Award
Fredric Fey, for his exemplification of everything Al Lieberman stood for in mentoring newcomers into the field and his generous devotion of time to help people improve and advance.

Exceptional Woman Contributor Award
Anne Marie Dixon, for her dedication to IEST as a veteran expert instructor, as a Working Group Chair, and as President Emeritus, contributions recognized in a Fellow designation; and to the field of contamination control, particularly her service to ISO/TC 209.

Milena Krasich, for her outstanding contributions to the field of reliability and her service to IEST in her roles as Journal of the IEST adviser and author, as an instructor, as a Working Group Chair, and as President Emeritus, contributions acknowledged in a Fellow designation.

John Martin Outstanding New Member Award
Lori Uram, for her commitment in becoming involved early in her membership as Vice Chair of WG003 and participating in other Working Groups, and her high potential to continue contributing in technical and leadership roles.

President’s Award
Ed Pennell, for his steadfast support and generous, ongoing commitment of resources toward ARAMARK’s participation in an array of IEST activities, including Working Groups, meetings and education, and the Executive Board.

Special Recognition
Eve Mattingley-Hannigan, for her long-time generous and unwavering support of IEST through the pages of TEST Engineering & Management magazine.